Bibliografia publikacji pracowników
Państwowej Szkoły Wyższej w Białej Podlaskiej
Baza tworzona przez Bibliotekę Akademii Bialskiej im. Jana Pawła II.
Zapytanie:
MICHALUK ESTERA Liczba odnalezionych rekordów: 5
Przejście do opcji zmiany formatu | Wyświetl/ukryj etykiety | Wyświetlenie wyników w wersji do druku | Pobranie pliku do edytora | Nowe wyszukiwanie Streszczenie: In a healthy physiological state, the mucous membrane of the oral cavity creates a suitable environment for the colonization of Candida spp. yeasts. The aim of the study was to analyze the nanomechanical properties of C. albicans cells derived from the oral cavity of healthy people in a biofilm produced in laboratory conditions. Candida spp. were sampled from the oral cavity of healthy individuals. The process of biofilm formation was analyzed using classic microscopic observation enriched with SEM (scanning electron microscope) and the nanomechanical properties of the cells were assessed with the use of the atomic force microscopy technique (AFM). From all isolated strains in the samples collected of the oral cavity healthy people was detected 79% C. albicans. Other isolated species belonged to the group "non-albicans". The observations of C. albicans carried out in 24-h cultures revealed a tendency of the cells to form a biofilm structure with multilayer cell systems. The diameter of C. albicans cells in this structure was 5.75 ľm, and the length of the pseudohyphae was 17.08 ľm. The presence of an extracellular substance surrounding the C. albicans cells was detected. The mean value of the adhesion force determined for C. albicans cells was 4.01 nN. Areas with increased hardness (Force Modulation Mode signal; FMM signal) were found mainly in the zones of cells in contact with the glass substrate. The analysis of Candida cells in liquid samples gives satisfactory results, as it prevents unfavorable changes in the cell surface and thus provides more reliable results. The quality of the biofilm is probably related to the nanomechanical properties of C. albicans cells and may consequently contribute to the stability of the biofilm structures and their susceptibility or resistance to antifungal drugs. The presence of Candida spp. especially in companion animals (dogs, cats) poses a risk of their transmission to the human organism. For this reason, it is advisable to undertake additional research to analyze the ability of zoonotic-origin Candida spp. to form biofilms with comparison of the biofilm-formation capacity of species isolated from humans. Projekt/grant: Zastosowanie mikroskopu sił atomowych (AFM) w ocenie własności nanomechanicznych Candida spp : Fundusz Grantów na Badania Własne / PSW Biała Podlaska, PB/1/2019
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Nr opisu: 0000046721 Autorzy: Patrycja Andrzejuk, Estera Michaluk. Charakterystyka formalna: udział w konferencji naukowej Język publikacji: ENG Słowa kluczowe ang.: Candida albicans ; healthy people ; nanomechanical properties ; oral mycobiota Uwaga: Poster session. Projekt/grant: Zastosowanie mikroskopu sił atomowych (AFM) w ocenie własności nanomechanicznych Candida spp : Fundusz Grantów na Badania Własne / PSW Biała Podlaska, PB/1/2019
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Nr opisu: 0000046722 Autorzy: Patrycja Teodorowicz, Małgorzata Tokarska-Rodak, Estera Michaluk, Marta Zarębska, Dorota Plewik, Tomasz Marek Grudniewski, Mariusz Sacharczuk. Tytuł pracy: Assessment of nanomechanical properties of Candida albicans as an element of the oral mycobiota in healthy subjects Tytuł całości: W: Slovenian Microbiome Network Symposium 2023 "Defining a Healthy Microbiome", 30.11-1.12.2023, Maribor, Slovenia : abstract book / ed. Nejc Stopniek, Sandra Janeič Miejsce wydania: Maribor Wydawca: National Laboratory of Health, Environment and Food Rok wydania: 2023 Strony zajęte przez pracę: P. 66-67 Charakterystyka formalna: streszczenie zjazdowe międzynarodowe (książka streszczeń) Charakterystyka merytoryczna: konferencja naukowa międzynarodowa Język publikacji: ENG Słowa kluczowe ang.: Candida albicans ; healthy people ; nanomechanical properties ; oral mycobiota https://slovenianmicrobiome.net/abstract_book/
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Nr opisu: 0000045222 Autorzy: Tomasz Marek Grudniewski, Estera Michaluk. Tytuł pracy: Research on the possibility of controlling the growth of thin copper layers deposited by DC magnetron sputtering Tytuł czasopisma: Szczegóły: 2023, Vol. 9, issue 4, article number e14936 p-ISSN: 2405-8440 Charakterystyka formalna: artykuł w czasopiśmie zagranicznym Charakterystyka merytoryczna: artykuł oryginalny naukowy Charakterystyka wg MNiSW: artykuł w czasopiśmie z IF (wykaz MEiN) Język publikacji: ENG Wskaźnik Impact Factor ISI: 4.000 Punktacja ministerstwa: 40.000 Słowa kluczowe ang.: layer topography ; photovoltaics ; Cu layers ; sputtering https://www.cell.com/heliyon/fulltext/S2405-8440(23)02143-6 DOI: 10.1016/j.heliyon.2023.314936 Streszczenie: This paper addresses the influence of the sputtering time and hence thickness of thin copper (Cu) layers on the grain size, surface morphology and electrical properties. Cu layers 54-853 nm thick were deposited by DC magnetron sputtering at room temperature from a Cu target with a sputtering power of 2.07 W × cm-2 in an argon atmosphere at a pressure of 8 × 10-3 mbar. The structural and electrical properties were determined on the basis of four-contact probe measurements, stylus profilometry, atomic force microscopy (AFM), scanning electron microscopy (SEM) with an X-ray microanalysis (EDS) detector, and X-ray diffraction (XRD). The results of the conducted experiments show that the structure of thin copper layers can significantly change depending on the thickness and deposition process parameters. Three characteristic areas of structural changes and growth of copper crystallites/grains were distinguished. Ra and the RMS roughness linearly increase with increasing film thickness, while the crystallite size significantly changes only for copper films thicker than 600 nm. In addition, the resistivity of the Cu film is reduced to approximately 2 ľ? × cm for films with a thickness on the order of 400 nm, and a further increase in their thickness does not have a significant effect on their resistivity. This paper also determines the bulk resistance for the Cu layers under study and estimates the reflection coefficient at the grain boundaries.